Search results for: C Bolchini
IEEE Embedded Systems Letters > 2010 > 2 > 4 > 107 - 110
Journal of Electronic Testing > 2008 > 24 > 1-3 > 35-44
IEEE Embedded Systems Letters > 2010 > 2 > 4 > 107 - 110
Journal of Electronic Testing > 2008 > 24 > 1-3 > 35-44