Search results for: Yuan Lu
IEEE Electron Device Letters > 2017 > 38 > 1 > 48 - 51
IEEE Electron Device Letters > 2016 > 37 > 8 > 998 - 1001
2015 IEEE International Electron Devices Meeting (IEDM) > 5.5.1 - 5.5.4
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
2010 International Electron Devices Meeting > 5.6.1 - 5.6.4
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2218 - 2228
IEEE Transactions on Electron Devices > 2007 > 54 > 1 > 90 - 97
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Electron Device Letters > 2007 > 28 > 7 > 643 - 645
IEEE Electron Device Letters > 2007 > 28 > 9 > 828 - 830