Search results for: S. Sahhaf
2011 International Reliability Physics Symposium > 2A.2.1 - 2A.2.10
Microelectronic Engineering > 2010 > 87 > 12 > 2614-2619
2010 IEEE International Reliability Physics Symposium > 1078 - 1081
IEEE Electron Device Letters > 2010 > 31 > 4 > 272 - 274
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1424 - 1432
2007 IEEE International Electron Devices Meeting > 501 - 504
Microelectronic Engineering > 2007 > 84 > 9-10 > 1925-1928