Search results for: V. Srividya
Solid State Electronics > 2013 > 84 > Complete > 22-27
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 323 - 334
2010 IEEE International Reliability Physics Symposium > 1078 - 1081
IEEE Electron Device Letters > 2010 > 31 > 4 > 272 - 274