Search results for: Y. Tagro
International Journal of Numerical Modelling: Electronic Networks, Devices... > 27 > 5-6 > 736 - 747
Solid State Electronics > 2013 > 90 > Complete > 73-78
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.3.1 - 3C.3.6
IEEE Electron Device Letters > 2012 > 33 > 9 > 1258 - 1260
2008 72nd ARFTG Microwave Measurement Symposium > 119 - 122