Search results for: C.M. Grens
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 431 - 439
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1529 - 1532
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1276 - 1285
IEEE Journal of Solid-State Circuits > 2008 > 43 > 9 > 1889 - 1896
IEEE Transactions on Electron Devices > 2007 > 54 > 7 > 1605 - 1616