Search results for: Cheng-Cheng Yen
Microelectronics Reliability > 2014 > 54 > 1 > 71-78
IEEE Transactions on Industrial Electronics > 2012 > 59 > 2 > 1278 - 1287
IEEE Transactions on Industrial Electronics > 2010 > 57 > 10 > 3533 - 3543
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 255 - 264
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 3-2 > 620 - 630
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1204 - 1210
2008 IEEE Asian Solid-State Circuits Conference > 409 - 412
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 1 > 13 - 21
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2533 - 2545