Wyniki wyszukiwania dla: Congyin Shi
Journal of Electronic Testing > 2018 > 34 > 3 > 313-320
IEEE Journal of Solid-State Circuits > 2017 > 52 > 8 > 2105 - 2116
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 9 > 2227 - 2237
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 1 > 280 - 292
IEEE Transactions on Circuits and Systems I: Regular Papers > 2013 > 60 > 1 > 95 - 107
Science China Information Sciences > 2013 > 56 > 1 > 1-5
IEEE Electron Device Letters > 2010 > 31 > 9 > 966 - 968
IEEE Journal of Solid-State Circuits > 2010 > 45 > 7 > 1316 - 1329