Search results for: A. Curutchet
Microelectronics Reliability > 2017 > 76-77 > C > 350-356
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
Microelectronics Reliability > 2016 > 64 > C > 594-598
Microelectronics Reliability > 2015 > 55 > 9-10 > 1741-1745