Search results for: R. Rao
2015 IEEE International Electron Devices Meeting (IEDM) > 16.3.1 - 16.3.4
2011 International Reliability Physics Symposium > CR.1.1 - CR.1.4
IEEE Communications Letters > 2011 > 15 > 4 > 455 - 457
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1855 - 1863
IEEE Electron Device Letters > 2010 > 31 > 11 > 1311 - 1313
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 637 - 643