Search results for: A.G. Metzger
Microelectronics Reliability > 2013 > 53 > 9-11 > 1471-1475
IEEE Journal of Solid-State Circuits > 2007 > 42 > 10 > 2137 - 2148
Microelectronics Reliability > 2013 > 53 > 9-11 > 1471-1475
IEEE Journal of Solid-State Circuits > 2007 > 42 > 10 > 2137 - 2148