Search results for: J. Van Olmen
Microelectronic Engineering > 2011 > 88 > 5 > 745-748
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 293 - 307
2010 International Electron Devices Meeting > 2.2.1 - 2.2.4
Microelectronics Reliability > 2010 > 50 > 9-11 > 1636-1640
Microelectronic Engineering > 2007 > 84 > 11 > 2681-2685
Microelectronics Reliability > 2000 > 40 > 8-10 > 1407-1412
Microelectronics Reliability > 1999 > 39 > 11 > 1657-1665
Microelectronics Reliability > 1998 > 38 > 6-8 > 1009-1013
Microelectronics Reliability > 1998 > 38 > 1 > 87-98
Microelectronics Reliability > 1997 > 37 > 12 > 1813-1816