Search results for: Matteo Meneghini
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Journal of Quantum Electronics > 2017 > 53 > 4 > 1 - 8
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-2.1 - 3B-2.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-5.1 - 4B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-1.1 - 4B-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 200 - 205
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2334 - 2339
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
IEEE Electron Device Letters > 2016 > 37 > 5 > 611 - 614
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2549 - 2554
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1987 - 1992
IEEE Electron Device Letters > 2014 > 35 > 10 > 1004 - 1006
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3119 - 3131