The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Recently the cell integration density of NAND flash memory is increasing rapidly due to its simple structure suitable for high resolution lithography. Therefore, the reduction of cell size has been the most important issue. However, with the increase in the number of the cells and the scale-down of the cell size, the NAND cell string has some problems such as small on-cell current and poor program/erase...
One of the most important issues of NAND flash memory is reliability problems caused by oxide and interface traps. But it has been revealed that their generation rate increases by Fowler-Nordheim current stressing on the tunnel oxide as the channel width of shallow trench isolation (STI) isolated NAND flash cells shrinks and electric field is increased at active edge of STI profile. By adjusting the...
Recently the cell integration density of NAND flash memory increases rapidly due to its simple structure suitable for high resolution lithography. However as the cell integration density increases, NAND flash memory cell shows the problem of increased parasitic capacitance between the cells. The problems are generated by the floating-gate interference during cell operation. In order to reduce the...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.