Search results for: R. Degraeve
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2907 - 2916
IEEE Electron Device Letters > 2010 > 31 > 10 > 1158 - 1160
IEEE Electron Device Letters > 2010 > 31 > 4 > 272 - 274
IEEE Electron Device Letters > 2010 > 31 > 1 > 77 - 79
Microelectronic Engineering > 2010 > 87 > 1 > 47-50
Microelectronic Engineering > 2009 > 86 > 7-9 > 1789-1795
Microelectronic Engineering > 2009 > 86 > 7-9 > 1807-1811
2009 IEEE International Reliability Physics Symposium > 1028 - 1032
2009 IEEE International Reliability Physics Symposium > 1014 - 1018
2009 Spanish Conference on Electron Devices > 238 - 241
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3285 - 3292
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1424 - 1432
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430