Search results for: I. Stanimirović
IEEE Sensors Journal > 2016 > 16 > 9 > 2935 - 2941
Microelectronics Reliability > 2008 > 48 > 1 > 59-67
Microelectronics Reliability > 2007 > 47 > 12 > 2242-2248
EUROCON 2005 - The International Conference on "Computer as a Tool" > 2 > 1687 - 1690
Microelectronics Reliability > 2003 > 43 > 6 > 905-911
Microelectronics Reliability > 2001 > 41 > 1 > 59-66