In this paper the results from a study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on resistor composition with sheet resistance of 1kOmega/sq are presented. For experimental purposes a series of thick-film test resistors with different geometries were realized and subjected to simultaneous electrical and mechanical straining using 1.2/50mus pulses in combination with mechanical substrate deflection of 300mum. Obtained experimental results were analyzed and correlation between resistance, noise index and gauge factor changes with resistor degradation due to simultaneous impact of these two types of straining were observed