Search results for: J.G. Tartarin
Microelectronics Reliability > 2017 > 76-77 > C > 344-349
2016 46th European Microwave Conference (EuMC) > 1409 - 1412
Microelectronics Reliability > 2015 > 55 > 9-10 > 1714-1718
Microelectronics Reliability > 2013 > 53 > 9-11 > 1491-1495
Microelectronics Reliability > 2012 > 52 > 9-10 > 2184-2187