Search results for: M. Vellvehı́
IEEE Electron Device Letters > 2017 > 38 > 4 > 505 - 508
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Novel SOI Devices and Sensors Operating at Harsh Conditions > 279-284
IEEE Transactions on Industrial Electronics > 2015 > 62 > 12 > 7774 - 7785
Microelectronics Reliability > 2014 > 54 > 9-10 > 2207-2212
Microelectronics Reliability > 2014 > 54 > 9-10 > 1839-1844
Microelectronics Reliability > 2013 > 53 > 8 > 1084-1094
Microelectronics Reliability > 2013 > 53 > 8 > 1076-1083
Microelectronics Reliability > 2012 > 52 > 9-10 > 2294-2300
Microelectronics Reliability > 2012 > 52 > 9-10 > 2314-2320