Search results for: Chieh-Ming Lai
Thin Solid Films > 2008 > 516 > 21 > 7741-7743
Microelectronics Reliability > 2007 > 47 > 6 > 944-952
IEEE Electron Device Letters > 2007 > 28 > 2 > 111 - 113
IEEE Electron Device Letters > 2007 > 28 > 2 > 142 - 144
IEEE Electron Device Letters > 2007 > 28 > 5 > 376 - 378
IEEE Transactions on Electron Devices > 2006 > 53 > 11 > 2779 - 2785