Search results for: F.L. Kastensmidt
Microelectronics Reliability > 2017 > 76-77 > C > 660-664
Microelectronics Reliability > 2017 > 76-77 > C > 640-643
Microelectronics Reliability > 2014 > 54 > 9-10 > 2344-2348
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1950 - 1957
IEEE Transactions on Computers > 2008 > 57 > 9 > 1202 - 1215
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2928 - 2935
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2281 - 2288
IEEE Design & Test of Computers > 2007 > 24 > 4 > 340 - 350