Search results for: Y. Mols
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 480 - 484
Journal of Crystal Growth > 2016 > 452 > C > 244-247
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2014 IEEE International Reliability Physics Symposium > 6A.2.1 - 6A.2.6
Thin Solid Films > 2008 > 517 > 1 > 148-151
Journal of Crystal Growth > 2007 > 298 > Complete > 758-761
Journal of Crystal Growth > 2003 > 247 > 3-4 > 237-244