Search results for: A Kumar
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 524 - 528
IEEE Micro > 2009 > 29 > 4 > 48 - 61
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2005 > 13 > 3 > 401 - 405
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 524 - 528
IEEE Micro > 2009 > 29 > 4 > 48 - 61
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2005 > 13 > 3 > 401 - 405