Search results for: T. Kawanago
Microelectronics Reliability > 2016 > 60 > C > 16-19
Microelectronic Engineering > 2013 > 109 > Complete > 322-325
Solid State Electronics > 2013 > 84 > Complete > 53-57
2013 Spanish Conference on Electron Devices > 257 - 260
Microelectronics Reliability > 2012 > 52 > 9-10 > 1909-1912
Solid State Electronics > 2012 > 74 > Complete > 2-6
Solid State Electronics > 2012 > 68 > Complete > 68-72
Microelectronic Engineering > 2010 > 87 > 10 > 1868-1871
Solid State Electronics > 2010 > 54 > 7 > 715-719
Microelectronics Reliability > 2010 > 50 > 3 > 356-359
Microelectronic Engineering > 2009 > 86 > 7-9 > 1629-1631