Search results for: N. Wrachien
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-6-1 - EL-6-5
Solid State Electronics > 2015 > 113 > Complete > 151-156
Microelectronics Reliability > 2015 > 55 > 9-10 > 1790-1794
Microelectronics Reliability > 2015 > 55 > 9-10 > 1795-1799
Microelectronics Reliability > 2014 > 54 > 9-10 > 1638-1642
Microelectronics Reliability > 2013 > 53 > 9-11 > 1798-1803
Microelectronics Reliability > 2013 > 53 > 9-11 > 1804-1808
2013 IEEE International Reliability Physics Symposium (IRPS) > 4B.3.1 - 4B.3.7
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.8.1 - XT.8.6
Microelectronics Reliability > 2012 > 52 > 9-10 > 2495-2499
Microelectronics Reliability > 2012 > 52 > 9-10 > 2490-2494
2012 IEEE International Reliability Physics Symposium (IRPS) > 3D.4.1 - 3D.4.7
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.6.1 - XT.6.7
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2979 - 2986
Microelectronics Reliability > 2011 > 51 > 9-11 > 1762-1766
2011 International Reliability Physics Symposium > 2E.2.1 - 2E.2.8
IEEE Electron Device Letters > 2011 > 32 > 4 > 488 - 490
Microelectronics Reliability > 2010 > 50 > 9-11 > 1866-1870