Search results for: L.W.
IEEE Transactions on Nuclear Science > 2009 > 56 > 1-2 > 208 - 213
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 135 - 144
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2400 - 2406
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1772 - 1778
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1794 - 1798