Search results
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 2 > 121 - 125
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 5-1 > 1456 - 1464
Analog Integrated Circuits and Signal Processing > 2017 > 93 > 2 > 237-243
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1861 - 1864
IEEE Sensors Journal > 2017 > 17 > 5 > 1211 - 1212
Superlattices and Microstructures > 2017 > 102 > Complete > 17-26
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 2 > 310 - 321
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 621 - 634
IEEE Transactions on Power Electronics > 2017 > 32 > 2 > 1156 - 1169
Organic Electronics > 2017 > 41 > C > 345-354
Archives of Electrical Engineering > 2017 > Vol. 66, nr 2 > 313--323
IEEE Electron Device Letters > 2017 > 38 > 1 > 16 - 19
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 1 > 16 - 20
IEEE Sensors Journal > 2016 > 16 > 24 > 8897 - 8907
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 12 > 1161 - 1165
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 513 - 520
Solid-State Electronics > 2016 > 126 > C > 32-35
Microwave and Optical Technology Letters > 59 > 1 > 145 - 148
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
IEEE Transactions on Power Electronics > 2016 > 31 > 11 > 7770 - 7779