Search results
2011 International Reliability Physics Symposium > 5C.4.1 - 5C.4.5
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 7 > 2455 - 2461
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 3 > 420 - 427
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2022 - 2027
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 2756 - 2759
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 2447 - 2450
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 303 - 311
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 2 > 466 - 478
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 103 - 106
IEEE Electron Device Letters > 2011 > 32 > 6 > 818 - 820
IEEE Electron Device Letters > 2011 > 32 > 4 > 527 - 529
IEEE Electron Device Letters > 2011 > 32 > 2 > 140 - 142
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 486 - 489
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 2 > 338 - 344
IEEE Photonics Technology Letters > 2011 > 23 > 1 > 27 - 29
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 8 > 2001 - 2007