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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 9 - 19
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1148 - 1153
IEEE Transactions on Reliability > 2016 > 65 > 1 > 256 - 262
Proceedings of the National Academy of Sciences, India Section B: Biological... > 2017 > 87 > 4 > 1355-1362
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 2 > 306 - 313
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 1 > 266 - 274
Biological Research > 2016 > 49 > 1 > 1-10
Industrial Crops and Products > 2015 > 76 > C > 1086-1093
IEEE Electron Device Letters > 2015 > 36 > 12 > 1274 - 1276
IEEE Transactions on Dielectrics and Electrical Insulation > 2015 > 22 > 6 > 3170 - 3176
Psychiatry Research > 2015 > 229 > 3 > 895-900
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 10 > 2065 - 2076
Journal of Psychiatric Research > 2015 > 69 > Complete > 120-125
Pathologie Biologie > 2015 > 63 > 4-5 > 230-234
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 384 - 393
Experimental Gerontology > 2015 > 68 > Complete > 26-32
Neuroscience and Biobehavioral Reviews > 2015 > 55 > Complete > 333-364
IEEE Transactions on Power Delivery > 2015 > 30 > 3 > 1331 - 1337
IEEE Transactions on Power Delivery > 2015 > 30 > 3 > 1145 - 1152