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IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4753 - 4765
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 381 - 398
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 6 > 829 - 837
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 298 - 306
IEEE Transactions on Industrial Electronics > 2017 > 64 > 6 > 4857 - 4865
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 5 > 762 - 767
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Computers > 2017 > 66 > 4 > 616 - 630
IEEE Transactions on Industry Applications > 2017 > 53 > 2 > 1106 - 1115
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 1012 - 1022
IEEE Transactions on Systems, Man, and Cybernetics: Systems > 2017 > 47 > 3 > 462 - 473
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1045 - 1052
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 69 - 79
IEEE Photonics Journal > 2017 > 9 > 1 > 1 - 14
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 660 - 669
IEEE Transactions on Power Electronics > 2017 > 32 > 2 > 1431 - 1441
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102