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IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 307 - 316
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 317 - 323
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1842 - 1848
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 529 - 536
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 516 - 523
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1964 - 1970
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2213 - 2217
IEEE Electron Device Letters > 2009 > 30 > 9 > 972 - 974
Proceedings of the IEEE > 2009 > 97 > 10 > 1687 - 1714
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1442 - 1450
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 2 - 12
IEEE Electron Device Letters > 2009 > 30 > 4 > 340 - 342
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1433 - 1441
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 120 - 127
IEEE Transactions on Magnetics > 2009 > 45 > 3 > 1336 - 1339
IEEE Electron Device Letters > 2009 > 30 > 3 > 298 - 301
IEEE Transactions on Dielectrics and Electrical Insulation > 2009 > 16 > 1 > 171 - 178
IEEE Transactions on Dielectrics and Electrical Insulation > 2009 > 16 > 1 > 179 - 188
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 352 - 357
IEEE Transactions on Energy Conversion > 2008 > 23 > 1 > 9 - 14