Search results for: Anthony S Oates
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 652
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 521
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 132 - 137
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 473
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 115 - 122
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 769 - 775
2014 IEEE International Electron Devices Meeting > 20.7.1 - 20.7.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 327 - 332
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 529 - 531
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 4 > 551 - 554
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 4 > 540 - 547