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IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2073 - 2080
IEEE Electron Device Letters > 2009 > 30 > 8 > 840 - 842
Proceedings of the IEEE > 2009 > 97 > 10 > 1687 - 1714
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1086 - 1093
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 678 - 682
IEEE Transactions on Electron Devices > 2009 > 56 > 3 > 441 - 447
IEEE Electron Device Letters > 2009 > 30 > 2 > 145 - 147
IEEE Electron Device Letters > 2009 > 30 > 3 > 231 - 233
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 128 - 134
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 65 - 69
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 59 - 65
IEEE Electron Device Letters > 2009 > 30 > 7 > 721 - 723
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Electron Device Letters > 2008 > 29 > 2 > 155 - 157
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 844 - 849
IEEE Electron Device Letters > 2008 > 29 > 7 > 734 - 736
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 1960 - 1967
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2348 - 2353
IEEE Electron Device Letters > 2007 > 28 > 10 > 874 - 876
IEEE Electron Device Letters > 2007 > 28 > 11 > 996 - 999