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IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 634 - 637
IEEE Transactions on Nuclear Science > 2017 > 64 > 2 > 859 - 866
IEEE Electron Device Letters > 2017 > 38 > 2 > 187 - 190
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 153 - 158
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 256 - 263
IEEE Electron Device Letters > 2017 > 38 > 1 > 52 - 55
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
IEEE Access > 2017 > 5 > 17772 - 17780
IEEE Electron Device Letters > 2016 > 37 > 12 > 1621 - 1624
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4346 - 4351
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4331 - 4338
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4309 - 4314
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 424 - 429
Journal of Display Technology > 2016 > 12 > 11 > 1238 - 1241
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 11 > 1034 - 1038