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Aiming at nonlinear degradation data in step-stress accelerated degradation test (SSADT), the reliability assessment method is put forward based on Wiener process. the process and degradation data model of SSADT is analyzed. The time scale model is used to convert nonlinear data into linear data. Draft coefficient of Wiener process is regarded as a random variable. Reliability model for nonlinear...
A comparative investigation of the reliability of 60Coγ ray irradiation on bulk-Si substrate and SOI substrate double polysilicon self-aligned (DPSA) NPN bipolar transistors is presented. Bulk silicon based DPSA NPN transistors show severe current gain degradation at low injection level, and a monotonic increase in current gain degradation with decreasing Emitter-Base (E-B) voltage is observed. SOI...
In this paper, the radiation response of 90nm bulk Si MOS devices irradiated by heavy ions is experimentally studied. Due to the intrinsic random incident of heavy ions, different performance degradation is observed, such as threshold voltage shift, saturation current change and maximum transconductance degradation. These performance degradations may be attributed to the displacement damage in channel...
We investigate factors affecting device performance of deep-etched InAs/GaAs quantum-dot ridge-lasers grown directly on silicon substrates, emitting close to 1.3-μm. Continuous-wave reliability measurements show there is a significant reduction in degradation, in terms of threshold current and slope efficiency, as the cavity length is increased.
Remaining useful life (RUL) prediction is a key link in prognostics and health management. More accurate RUL prediction results will lead to more reasonable decision making on sequential management activities including maintenance, replacement, spare parts ordering, etc. In engineering practice, many products exhibit more volatile degradation paths when they have high degradation rates. By this observation,...
Non-binary low-density parity-check codes have better communication performance compared to their binary counterparts but they suffer from higher complexity, especially for the check node processing. In this paper a sorting of the input vectors based on a reliability criteria is performed prior to the check node processing. This presorting process allows the Extended Min-Sum (EMS) check node process...
Interest in resorbable and biodegradable materials originates from their potential in food packaging, environmental science and ecology, but also in medicine and biotechnology. Till very recently, electronics has not been on such development paths. However, recent advancements in material science, thin processing and nanotechnology offer the prospective of high performance electronic devices which...
The paper considers the issues of burning metal jumpers on the surface of a semiconductor by current pulses of different shapes. Discovered that the passage of single rectangular current pulse with a duration of no more than 60 μs and an energy of 90 mJ observed the predominance of the processes of melting metal film over the contact melting at the interface. Current pulses of non-rectangular form...
Through Silicon Via(TSVs) technology is one of the most prominent feature in future microelectronic devices packaging. Since TSVs contain the interfaces of heterogeneous materials that have high CTE mismatch, and would hence produce large thermal stresses under temperature loading, often leading to mechanical failure. A failure stress mathematical model is established and the algorithm of mathematical...
In the recent times, due to the high depletion rates of availability of fossil fuels, solar energy is substituting as one of the excellent options for power grid evolution. Any system under operation is susceptible to faults due to internal and external factors. The identification of certain faults not only consumes more time but also leads to wastage of resources due to unwanted maintenance strategies...
The performance of mc-Si PERC solar cells can be significantly affected by LeTID. The underlying mechanism causing LeTID is still unknown. This work compares the degradation and regeneration behavior under illumination and elevated temperature of an industrial mc-Si PERC solar cell to differently processed minority charge carrier lifetime samples. A strong degradation and also regeneration can be...
Potential transitions in the boron-oxygen defect system are investigated using kinetic modeling and experimental data. Strong evidence is shown that no direct pathway occurs for passivation from state A and to C, and therefore, defects require formation prior to passivation. Whilst it is more difficult to rule out a possible destabilisation reaction as occurring from state C to state A, the system...
The effect of varying plasma etching process time on alkaline textured mono-crystalline silicon has been investigated and applied for industrial process. Reduced surface reflectance is observed for longer plasma etching process time, with the tradeoff having lower effective carrier lifetime induced by plasma damage. The degradation is further caused by the mismatch of the surface morphology and ionic...
This paper presents an analysis of the electrical and visual degradation data gathered in the 2nd All India Survey of Photovoltaic Module Reliability, conducted in 2014, in which a total of 1148 modules were inspected in different climatic zones of India. The modules in the Hot Climates are seen to degrade faster than modules in the Non-Hot climates. Fill Factor (FF) reduction has been found to be...
Breakdown voltage instability mechanism of Trench Field Plate Power MOSFET was studied. We found that breakdown voltage (BVDSS) shifts obeyed power-law time dependence by analysis of time dependent BVDSS shifts. Furthermore, stress / suspend measurements revealed that BVdss shift repeated increase / recovery behaviors. These results were discussed by Si-H bond dissociation Reaction-Diffusion (R-D)...
The Hybrid fingerprint is a local-quality-specific blend of the surface and internal fingerprints, extracted from optical coherence tomography scans. Owing to its origin, and the manner in which it is obtained, the Hybrid fingerprint is a high-quality and secure fingerprint acquisition solution. This research entails a detailed description of the Hybrid fingerprint, the techniques involved to produce...
As a potential candidate for solid-state switches in low-power electronic circuits, the Tunnel Field Effect Transistor (TFET) has attracted the attention of device designers in the past few years. Although simulations have shown that ideal hetero TFETs can achieve sub-thermal sub-threshold swing (SS), the fabrication of a TFET with sufficient on-current and sub-thermal SS over a few decades of drain...
An ultra-thinning down to 2.6-um using 300-mm 2Gb DRAM wafer has been developed. Effects of Si thickness and Cu contamination at wafer backside in terms of DRAM yield and retention characteristics are described. Total thickness variation (TTV) after thinning was below 1.9-um within 300-mm wafer. A degradation of retention characteristics occurred after thinning down to 2.6-um while no degradation...
An analysis on the degradation of DRAM performance caused by the NBTI degradation of p-MOSFET is first to be reported. To improve the NBTI immunity, three candidates are examined. First, minimizing Si-H bonds at Si/SiON interface through controlling the heat-budget at BEOL shows a promising result in NBTI lifetime, but it is not appropriate for DRAM process since it decreases the refresh time. Next,...
This paper presents an analysis of the degradation of n-type Bifacial Solar Cells submitted to potential induced degradation (PID) stress. PID is one of the main causes of performance degradation during the operating life of a solar cell and the study of the degradation kinetics is fundamental to prevent the excessive deterioration of the conversion efficiency. We report the results obtained on cells...
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