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The negative branch impedance of the transformer's T branch model was investigated as to its effects on current reversals in the delta tertiary winding and transformer neutral. Along with the negative branch values small positive values allowed current reversals in the transformer's neutral. Given the importance of accuracy the model should be developed with zero sequence impedances derived from zero...
This paper describes a novel testing framework for RTL Designs. The framework emphasizes effectiveness of automated black box testing of RTL Designs. The proposed test framework requires minimum human intervention and test cases can be executed with a single click. For extensively generic based testbench, our test framework can be made highly configurable. We can easily integrate any RTL design and...
This paper discusses the modelling and simulation of an EV power train in forward vehicle modelling approach in Simulink. The real-time simulation is an efficient mechanism in EV power train analysis and hardware-in-loop testing of Electronic Control Unit (ECU). This enables ECU software development, calibration and testing in closed loop without the actual vehicle. Due to the developments in processor...
The signal interference technique is firstly employed to design the common-mode filter (CMF) for differential digital circuit applications. Using the network analysis, design curves for three common-mode transmission zeros are available by simple steps. A test sample is realized in two-layer PCB. The fractional bandwidth of common-mode suppression band (|Scc21| < −10 dB) is 63 %, from 3.85 GHz...
Structural tests provide high defect coverage by considering the low-level circuit details. Functional test provides a faster test with reduced test patterns and does not imply additional hardware overhead. However, it lacks a quantitative measure of structural fault coverage. This paper fills this gap by presenting a satisfiability based method to generate functional test patterns while considering...
An non-volatile logic (NVL) -based system chip uses non-volatile storage elements to backup working state of volatile storage elements in sleep mode such that the power of chip can be turned off and zero standby power can be achieved. Since an NVL-based system chip consists of logic circuits and non-volatile storage elements, tests for logic circuits only and for non-volatile memories only are not...
A digital micro fluidic biochip (DMFB) is an attractive platform for immunoassays, point-of-care clinical diagnostics, DNA sequencing, and other laboratory procedures in biochemistry. Effective testing methods are required to ensure robust DMFB operation and high confidence in the outcome of biochemical experiments. Prior work on DMFB testing does not address the problem of designing the test to minimize...
Traditional BSIM MOSFET model extraction considers I-V/C-V curve fitting to capture DC non-linearity and S-parameter fitting to capture high-frequency small-signal behavior. This leads to poor accuracy when modeling MOSFETs in large-signal RF circuits such as power amplifiers, which require to model high-frequency large-signal behavior of MOSFETs. In this paper, we proposed an automatic method for...
This work develops an automated household utility power monitoring system and data logging in real-time. It utilizes the Arduino Uno Rev3 Microcontroller board intended for use in conjunction with the ATmega328 chip. For monitoring these parameters, it will be connected to a current transformer through the current and voltage sensor circuit. The system will convert these raw data to digital input...
In model-based design of cyber-physical systems, such as switched mixed-signal circuits or software-controlled physical systems, it is common to develop a sequence of system models of different fidelity and complexity, each appropriate for a particular design or verification task. In such a sequence, one model is often derived from the other by a process of simplification or implementation. E.g. a...
Two-dimensional finite difference time domain (2D-FDTD) method is a very powerful electromagnetic numerical method for simulating electromagnetic(EM) problems of a complicated printed circuit board (PCB). However, due to the lack of transversal components of electric field intensities, it is hard to contain the coupling effect among isolated power/ground islands. In order to simulated the EM performance...
This paper focuses on a novel modeling method for Interior Permanent Magnet (IPM) synchronous machines. This modeling method is based on a flux table which is obtained from experimental testing. As indicated by the comparison between computer simulation and dyno testing, this modeling approach can model the nonlinear behavior of Interior Permanent Magnet synchronous machines with high fidelity without...
This paper presents a kind of HVIGBT transient mixture model and corresponding parameter extraction method. The HVIGBT model can divide into MOSFET and BJT two parts. The two models are formed respectively according to HVIGBT work principle, in addition, the carrier transport equations have been simplified for avoiding Kirk effect in BJT model. The transient model is realized in PSIM software in the...
This paper describes current ongoing research pertaining to the analysis of design radiation hardness for circuits implemented in Field-Programmable Gate Array (FPGA) devices. Radiation induces single event effects in FPGAs that can cause erroneous operation by upsetting data bits or changing logic behavior. Design-level techniques can help mitigate these upsets to some degree; however, there is currently...
Switching voltage regulator (VR) modeling has numerous advantages over the conventional state average VR modeling methodology, in terms of accuracy, functionality, tuning capability, and extended applications on EMI. In previous work, switching VR modeling based on Pspice was discussed [1]. However, it is fairly accurate with simulation time limited by circuit complexity and often results in convergence...
In this paper we present a systematic method to evaluate radiation of multi-port integrated connector modules (ICM) by S-parameters. A novel test jig is designed and built to measure S-parameters of two columns of ICM ports simultaneously. Based on radiation physics of ICM, a radiation model is created and an F factor to correlate S-parameters to far field radiation is defined. A good correlation...
Modern digital circuits are, with each technological evolution, increasingly affected by Single Event Upsets (SEUs). In this paper we propose a static analysis approach for the estimation of the SEU sensitivity of the system under design by identifying untestable faults. The approach relies on a formal specification language to model circuits at the gate-level and on the Linear Temporal Logic (LTL)...
As fabrication technology scales towards smaller transistor sizes, lower critical charge, and higher operating frequencies, single-event radiation effects are more likely to cause errant behavior in multiple, physically adjacent devices in modern integrated circuits (ICs). In order to increase future system reliability, circuit designers need greater awareness of multiple-transient charge-sharing...
In this paper we show that the problem of deterministically factoring multivariate polynomials reduces to the problem of deterministic polynomial identity testing. Specifically, we show that given an arithmetic circuit (either explicitly or via black-box access) that computes a multivariate polynomial f, the task of computing arithmetic circuits for the factors of f can be solved deterministically,...
This paper reports a new scalable behavioral modeling technique for silicon controlled rectifier (SCR) based electrostatic discharge (ESD) protection structures using Verilog-A language. Accurate models were developed for various low-triggering voltage SCR ESD (LVSCR) protection structures implemented in a foundry 180nm RF process, which were validated by circuit simulation and ESD measurement.
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