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IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3869 - 3875
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 298 - 303
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3869 - 3875
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 298 - 303