Search results
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-1.1 - 2B-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1851 - 1856
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1482 - 1488
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1830 - 1836
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 674 - 691
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 720 - 734
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1336 - 1342
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 245 - 252
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 916 - 922
IEEE Sensors Journal > 2017 > 17 > 5 > 1399 - 1406
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 760 - 768
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 659 - 673
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 432 - 437
IEEE Electron Device Letters > 2017 > 38 > 1 > 48 - 51