Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 35 - 38
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 322 - 330
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Electron Device Letters > 2018 > 39 > 1 > 39 - 42
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 282 - 289
IEEE Photonics Technology Letters > 2018 > 30 > 1 > 59 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 11 - 18
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 215 - 222
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 347 - 351
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Electron Device Letters > 2018 > 39 > 1 > 79 - 82
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 331 - 338
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 339 - 346
IEEE Transactions on Information Forensics and Security > 2018 > 13 > 1 > 79 - 93
IEEE Transactions on Visualization and Computer Graphics > 2018 > 24 > 1 > 215 - 225
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 124 - 133
IEEE Transactions on Industrial Electronics > 2018 > 65 > 1 > 597 - 607