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IEEE Transactions on Nuclear Science > 2017 > 64 > 6-2 > 1554 - 1561
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 6 > 1978 - 1982
Microprocessors and Microsystems > 2017 > 51 > C > 209-219
Journal of Electronic Testing > 2017 > 33 > 4 > 449-462
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-5.1 - SE-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-7.1 - SE-7.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 2E-3.1 - 2E-3.4
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-1.1 - SE-1.4
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 12 - 19
Integration, the VLSI Journal > 2017 > 57 > C > 11-19