Search results
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-4.1 - 2A-4.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-1.1 - WB-1.6
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1007 - 1014
IEEE Transactions on Industry Applications > 2016 > 52 > 3 > 2554 - 2563
2016 IEEE International Reliability Physics Symposium (IRPS) > ES-1-1 - ES-1-8
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-6-1 - XT-6-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Electron Device Letters > 2016 > 37 > 1 > 84 - 87
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2940 - 2944
2015 IEEE International Reliability Physics Symposium > 6C.6.1 - 6C.6.6
2015 IEEE International Reliability Physics Symposium > 3E.4.1 - 3E.4.5
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 248 - 257
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 316 - 323