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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4131 - 4136
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4363 - 4367
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Electron Device Letters > 2017 > 38 > 9 > 1252 - 1255
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3126 - 3131
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4776 - 4784
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 399 - 403
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2505 - 2511
IEEE Electron Device Letters > 2017 > 38 > 5 > 592 - 595
IEEE Electron Device Letters > 2017 > 38 > 5 > 580 - 583
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1774 - 1781
IEEE Transactions on Computers > 2017 > 66 > 4 > 616 - 630
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1723 - 1727
IEEE Electron Device Letters > 2017 > 38 > 4 > 465 - 468