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IEEE Transactions on Industrial Electronics > 2018 > 65 > 3 > 2189 - 2198
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 142 - 149
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 23 - 30
IEEE Electron Device Letters > 2018 > 39 > 1 > 35 - 38
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 1954 - 1967
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4435 - 4441
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4131 - 4136
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4363 - 4367
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8334 - 8343
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621