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Microelectronic Engineering > 2014 > 114 > Complete > 47-51
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29
Microelectronic Engineering > 2014 > 114 > Complete > 47-51
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29