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Microelectronics Reliability > 2018 > 80 > C > 14-23
Microprocessors and Microsystems > 2017 > 53 > C > 120-129
IEEE Electron Device Letters > 2017 > 38 > 2 > 255 - 257
2017 IEEE Radio and Wireless Symposium (RWS) > 108 - 110
Micro- and Opto-Electronic Materials, Structures, and Systems > Moisture Sensitivity of Plastic Packages of IC Devices > 411-434
More than Moore > 279-303
IEEE Journal of Selected Topics in Quantum Electronics > 2015 > 21 > 4 > 1 - 9