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Metrology and Measurement Systems > 2018 > Vol. 25, nr 4 > 675--687
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 5 > 1040 - 1050
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 1 > 230 - 240
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3252 - 3257