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IEEE Journal of Solid-State Circuits > 2016 > 51 > 9 > 1965 - 1974
Electronics Letters > 2016 > 52 > 15 > 1319 - 1321
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Reliability and Operation of SOI Devices in Harsh Environment > 155-166
IEEE Transactions on Plasma Science > 2010 > 38 > 5 > 1118 - 1123
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2327 - 2334
Microelectronics Journal > 2004 > 35 > 3 > 299-304
Materials Science & Engineering B > 1999 > 61-62 > Complete > 330-338
Sensors & Actuators: A. Physical > 1996 > 52 > 1-3 > 187-192