Search results
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 1 > 199 - 206
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 11 > 3747 - 3759
IEEE Transactions on Plasma Science > 2015 > 43 > 9-1 > 2828 - 2831
IEEE Transactions on Plasma Science > 2013 > 41 > 12-2 > 3545 - 3557
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 388 - 397
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 2 > 456 - 461
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 187 - 191
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 644 - 653
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 10 > 3418 - 3426
IEEE Transactions on Electromagnetic Compatibility > 2009 > 51 > 3-2 > 774 - 783
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 412 - 418
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 206 - 210
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 2 > 268 - 276
IEEE Transactions on Plasma Science > 2008 > 36 > 5-2 > 2395 - 2403
IEEE Transactions on Circuits and Systems I: Regular Papers > 2007 > 54 > 11 > 2541 - 2551
IEEE Transactions on Microwave Theory and Techniques > 2007 > 55 > 12-2 > 2822 - 2831