Search results for: Wolfgang H Krautschneider
Materials Science & Engineering C > 2014 > 37 > Complete > 177-183
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2682 - 2689
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 7 > 1972 - 1981
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 2 > 130 - 135
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 187 - 191
Microelectronics Reliability > 1995 > 35 > 3 > 365-376