Wyniki wyszukiwania
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 388 - 394
Microelectronics Reliability > 2017 > 74 > C > 1-8
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 393 > C > 39-43
Thin Solid Films > 2016 > 618 > PA > 172-177
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2956 - 2964
Materials Science in Semiconductor Processing > 2015 > 33 > Complete > 161-168
Electronics Letters > 2015 > 51 > 4 > 362 - 364
Thin Solid Films > 2014 > 562 > C > 166-171
Nuclear Inst. and Methods in Physics Research, A > 2014 > 748 > Complete > 70-78
Microelectronic Engineering > 2014 > 116 > Complete > 17-21
Microwave and Optical Technology Letters > 56 > 4 > 932 - 935